DocumentCode :
870442
Title :
Absence of quantum 1/f noise in the photoelectric current of junction of MIS photodetectors
Author :
Handel, Peter H.
Author_Institution :
Dept. of Phys., Missouri Univ., St. Louis, MO
Volume :
40
Issue :
4
fYear :
1993
fDate :
4/1/1993 12:00:00 AM
Firstpage :
833
Abstract :
Quantum 1/f noise is given by a simple engineering formula. It affects photodetectors through mobility and recombination speed fluctuations. The former are also in the diffusion constant, and all affect the dark current. However, there is no quantum 1/f noise in the photogeneration of carriers, as is shown
Keywords :
metal-insulator-semiconductor devices; photodetectors; semiconductor device models; semiconductor device noise; MIS photodetectors; junction photodetectors; photoelectric current; photogeneration of carriers; quantum 1/f noise absence; Dark current; Fluctuations; Frequency; Fusion power generation; Particle scattering; Photodetectors; Physics; Radiative recombination; Schottky diodes; Spontaneous emission;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.202800
Filename :
202800
Link To Document :
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