• DocumentCode
    870567
  • Title

    Genetic algorithms applied to optimal tolerance levels of multiattribute inspection errors

  • Author

    Sohn, So Young ; Moon, Hyoung Uk

  • Author_Institution
    Dept. of Comput. Sci. & Ind. Syst. Eng., Yonsei Univ., Seoul, South Korea
  • Volume
    26
  • Issue
    4
  • fYear
    2003
  • Firstpage
    338
  • Lastpage
    344
  • Abstract
    In modern manufacturing environment, inspection equipment often can deal with more than one quality characteristic simultaneously. At the design stage of such inspection equipment, it is necessary to identify optimal combination of inspection error tolerance levels of multiattributes. We suggest a genetic algorithm by which one can determine the optimal tolerance levels of errors for multiinspection attributes at a minimum cost of ownership (COO). The COO model is formulated as a function of not only the initial purchase cost but also the inspection cost over lifetime. Our approach is expected to effectively contribute to marketing as well as manufacturing of inspection equipment.
  • Keywords
    error analysis; genetic algorithms; inspection; optimal control; tolerance analysis; cost of ownership; genetic algorithm; inspection cost; inspection equipment; manufacturing environment; multiattribute inspection errors; optimal tolerance levels; Cost function; Flat panel displays; Frequency; Genetic algorithms; Inspection; Manuals; Manufacturing; Moon; Semiconductor device modeling; Standards development;
  • fLanguage
    English
  • Journal_Title
    Electronics Packaging Manufacturing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-334X
  • Type

    jour

  • DOI
    10.1109/TEPM.2003.822081
  • Filename
    1262388