DocumentCode

870595

Title

Properties of avalanche breakdown in the GaAs thin-film switch

Author

Mizushima, Y. ; Igarashi, Yoichiro ; Ochi, O.

Volume

53

Issue

5

fYear

1965

fDate

5/1/1965 12:00:00 AM

Firstpage

509

Lastpage

510

Keywords

Avalanche breakdown; Breakdown voltage; Crystals; Electric breakdown; Electrons; Gallium arsenide; Ionization; Magnetic field measurement; Switches; Transistors;

fLanguage

English

Journal_Title

Proceedings of the IEEE

Publisher

ieee

ISSN

0018-9219

Type

jour

DOI

10.1109/PROC.1965.3850

Filename

1445780