DocumentCode :
871472
Title :
The effects of point-contact pressure on silicon planar junctions
Author :
Selway, P.R.
Volume :
53
Issue :
6
fYear :
1965
fDate :
6/1/1965 12:00:00 AM
Firstpage :
618
Lastpage :
619
Keywords :
Charge measurement; Current measurement; Diodes; Electrical resistance measurement; P-n junctions; Photonic band gap; Probes; Silicon; Space charge; Stress;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1965.3932
Filename :
1445862
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=871472
