DocumentCode

871472

Title

The effects of point-contact pressure on silicon planar junctions

Author

Selway, P.R.

Volume

53

Issue

6

fYear

1965

fDate

6/1/1965 12:00:00 AM

Firstpage

618

Lastpage

619

Keywords

Charge measurement; Current measurement; Diodes; Electrical resistance measurement; P-n junctions; Photonic band gap; Probes; Silicon; Space charge; Stress;

fLanguage

English

Journal_Title

Proceedings of the IEEE

Publisher

ieee

ISSN

0018-9219

Type

jour

DOI

10.1109/PROC.1965.3932

Filename

1445862