DocumentCode :
871528
Title :
An explanation of the "Energy" dependence of secondary breakdown in transistors
Author :
Reich, B. ; Hakim, E.B.
Volume :
53
Issue :
6
fYear :
1965
fDate :
6/1/1965 12:00:00 AM
Firstpage :
624
Lastpage :
625
Keywords :
Electric breakdown; Electrical resistance measurement; Equations; Error correction; Maximum likelihood detection; Sampling methods; Silicon; Thermal resistance; Voltage; Wiener filter;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1965.3938
Filename :
1445868
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=871528
