• DocumentCode
    871558
  • Title

    Effects of electron irradiation on metal-oxide semiconductor transistors

  • Author

    Stanley, A.G.

  • Volume
    53
  • Issue
    6
  • fYear
    1965
  • fDate
    6/1/1965 12:00:00 AM
  • Firstpage
    627
  • Lastpage
    628
  • Keywords
    Circuits; Conductors; Electrons; FETs; Impedance matching; Joining processes; Leakage current; MOS devices; Reflection; Voltage;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1965.3941
  • Filename
    1445871