DocumentCode

871641

Title

Impact ionization in cobalt-doped silicon

Author

Ghandhi, S.K. ; Park, J.N.

Volume

53

Issue

6

fYear

1965

fDate

6/1/1965 12:00:00 AM

Firstpage

635

Lastpage

635

Keywords

Cobalt; Electric breakdown; Impact ionization; Microwave devices; Pulse measurements; Semiconductor impurities; Silicon; Solids; Temperature; Testing;

fLanguage

English

Journal_Title

Proceedings of the IEEE

Publisher

ieee

ISSN

0018-9219

Type

jour

DOI

10.1109/PROC.1965.3949

Filename

1445879