• DocumentCode
    87182
  • Title

    Fabrication of Single Si Nanowire Metal–Semiconductor–Metal Device for Photodetection

  • Author

    Das, Kaustuv ; Samanta, Sudeshna ; Kumar, Prashant ; Narayan, K.S. ; Raychaudhuri, Arup Kumar

  • Author_Institution
    S.N. Bose Nat. Centre for Basic Sci., Kolkata, India
  • Volume
    61
  • Issue
    5
  • fYear
    2014
  • fDate
    May-14
  • Firstpage
    1444
  • Lastpage
    1450
  • Abstract
    The photoresponse of a metal-semiconductor-metal (MSM) device using single silicon nanowire (Si NW) (~50-nm diameter) with responsivity approaching 3 A/W and external quantum efficiency ~900% at a moderate bias of 1.0 V is reported. The device exhibits a rapid switching of the current when the light of wavelength 405 nm is turned ON/OFF even at zero bias. The dark and illuminated current-voltage characteristics are studied using the MSM device model. The analysis indicates that a dominant contribution to the photoresponse arises from the reduction of the barrier at the contact regions along with photoconductive response in the strand of the Si NW.
  • Keywords
    elemental semiconductors; metal-semiconductor-metal structures; nanowires; photodetectors; semiconductor quantum wires; silicon; MSM device model; Si; contact regions; current-voltage characteristics; dominant contribution; photoconductive response; quantum efficiency; single silicon nanowire; voltage 1 V; wavelength 405 nm; zero bias; Fabrication; Lighting; Nanoscale devices; Photoconductivity; Photodetectors; Resistance; Silicon; Metal??semiconductor??metal (MSM) device; photodetector; responsivity; silicon nanowire (Si NW);
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2014.2312234
  • Filename
    6802466