Analytical Calculation of Jitter Probability Density at Multistage Output Buffers Due to Supply Voltage Fluctuations

Author

Eunkyeong Park ; Hyungsoo Kim ; Jongjoo Shim ; Yong-Ju Kim ; Yun-Saing Kim ; Jingook Kim

Author_Institution

Sch. of ECE, Ulsan Nat. Inst. of Sci. & Technol., Ulsan, South Korea

Volume

57

Issue

4

fYear

2015

fDate

Aug. 2015

Firstpage

796

Lastpage

806

Abstract

The jitter probability density function (PDF) at multistage output buffers due to supply voltage fluctuations is analytically derived. For experimental validation, an integrated circuit (IC) is designed, fabricated, and assembled in a printed circuit board (PCB). The on-chip supply voltage fluctuations are extracted from the simultaneous measurements at the pads on IC and PCB and used to calculate the jitter PDF of the multistage buffers. Also, characteristics of the output channels are measured and modeled with the separately designed channel pattern. Finally, the jitter PDFs for multistage buffers are calculated and compared with the measured jitter histograms.

Keywords

buffer circuits; integrated circuit manufacture; jitter; printed circuits; probability; IC; PCB; channel pattern; integrated circuit; jitter PDF; jitter probability density analytical calculation; multistage output buffer; printed circuit board; voltage fluctuations; Integrated circuit modeling; Jitter; MOSFET; Probability density function; Voltage measurement; Clock tree; jitter; multistage; power distribution network (PDN); power-supply-induced jitter (PSIJ); probability density function (PDF); repeater; signal integrity;

fLanguage

English

Journal_Title

Electromagnetic Compatibility, IEEE Transactions on

Publisher

ieee

ISSN

0018-9375

Type

jour

DOI

10.1109/TEMC.2015.2403294

Filename

7054512