• DocumentCode
    8719
  • Title

    Control Plug Lateral Coupling Memory Cell Utilizing Uniform Channel Fowler–Nordheim Operation

  • Author

    Sung-Kun Park ; Kwang-Il Choi ; Eun-Mee Kwon ; In-Wook Cho ; Kyung-Dong Yoo

  • Author_Institution
    SK hynix, Cheongju, South Korea
  • Volume
    36
  • Issue
    3
  • fYear
    2015
  • fDate
    Mar-15
  • Firstpage
    241
  • Lastpage
    243
  • Abstract
    In this letter, we propose a control-plug (CP) structure logic nonvolatile memory (LNVM) fabricated by a standard logic CMOS process for mobile applications with low-power-consumption requirement. The operating concept of this cell is based on the use of a lateral capacitance coupling between a bar-type CP and a floating gate. Owing to the unique bar-type CP-coupling method and CP-sharing cell array structure, the novel cell has a coupling ratio of over 94% with the lowest fill factor of 344 as a Fowler-Nordheim (FN)-operated LNVM. Furthermore, because of the high coupling ratio and divided-bias operating method, this cell utilizes a uniform-channel FN tunneling program and erase method using a 3.3 V logic peripheral overdrive tolerable voltage of 5.5 V.
  • Keywords
    CMOS logic circuits; low-power electronics; random-access storage; CP-sharing cell array structure; LNVM; bar-type CP-coupling method; control plug lateral coupling memory cell; coupling ratio; divided-bias operating method; erase method; fill factor; lateral capacitance coupling; logic nonvolatile memory; low-power-consumption requirement; mobile applications; standard logic CMOS process; uniform channel Fowler-Nordheim operation; uniform-channel FN tunneling program; voltage 3.3 V; voltage 5.5 V; Arrays; Channel hot electron injection; Couplings; Logic gates; Microprocessors; Nonvolatile memory; Embedded flash; embedded Flash; lateral coupling; nonvolatile memory (NVM); select gate (SG); standard logic CMOS;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2015.2389897
  • Filename
    7004780