DocumentCode
871970
Title
Proton Upsets in Orbit
Author
Bendel, W.L. ; Petersen, E.L.
Author_Institution
Naval Research Laboratory Washington, D. C.
Volume
30
Issue
6
fYear
1983
Firstpage
4481
Lastpage
4485
Abstract
This paper presents a method of predicting proton-induced single event upset rates in spacecraft RAMs. The approach uses a sensitivity parameter A, determined from one or more experimental measurements of upset cross sections made at any proton energy above threshold. Parameter A uniquely determines a curve for the energy dependence of the upset cross section. This curve can be combined with the proton spectrum at the RAM to predict its upset rate. Predicted upset rates for 600 circular orbits are presented.
Keywords
Circuits; Energy measurement; Extraterrestrial measurements; Ionization; Orbital calculations; Protons; Scattering; Single event transient; Single event upset; Space vehicles;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.1983.4333158
Filename
4333158
Link To Document