• DocumentCode
    872299
  • Title

    ESDs on Solar Cells—Degradation, Modeling, and Importance of the Test Setup

  • Author

    Matéo-Vélez, Jean-Charles ; Inguimbert, Virginie ; Roussel, Jean-François ; Sarrail, Daniel ; Lévy, Léon ; Boulay, Françoise ; Laffont, Emmanuel ; Payan, Denis

  • Author_Institution
    ONERA, Toulouse
  • Volume
    36
  • Issue
    5
  • fYear
    2008
  • Firstpage
    2395
  • Lastpage
    2403
  • Abstract
    Cumulative electrostatic discharges (ESDs) on spacecraft solar cells result in the degradation of their performances. In this paper, silicon solar cells are tested in inverted voltage gradient situation obtained in plasma. ESDs occurring on the cells are detected by both electrical and optical signatures. To be representative of flight ESDs, the test setup must avoid unwanted coupling with ground arcs. The degradation is then evaluated by measuring the current-voltage characteristic of the cell in darkness. The equivalent shunt resistance allows quantifying this degradation, which can be attributed to material deposition on the cell edge or to local cell carbonization due to arcing. Visual inspection of the cells allows us to correlate ESD location and local degradation of the cell. The important parameter for solar cell degradation is the amount of energy dissipated during the discharge. A model of the plasma expansion from the cathode spot is compared to measurement. This model explains the current rise during the first phase of the discharge, which is the same for normal ESDs and coupling with ground ESDs.
  • Keywords
    arcs (electric); electrostatic discharge; solar cells; cathode spots; current-voltage characteristics; electrostatic discharges; equivalent shunt resistance; ground arcs; inverted voltage gradient situation; local cell carbonization; performance degradation; plasma expansion; solar cells; spacecraft solar cells; visual inspection; Arcing; electrostatic discharges (ESDs); plasma expansion model; solar cell degradation;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2008.2001835
  • Filename
    4631499