DocumentCode
872726
Title
DC analysis of an MOS source follower
Author
Frohman-Bentchkowsky, D. ; Vadasz, L.
Volume
3
Issue
3
fYear
1968
Firstpage
306
Lastpage
307
Abstract
The source follower operation of a normally off MOS device is analyzed. Input-output relationships in terms of applied voltages and device parameters are derived. Experimental verifications of the foregoing theory are included.
Keywords
Field effect devices; field effect devices; Doping; Equations; Impurities; Leakage current; Logic circuits; Logic devices; MOS devices; Threshold voltage;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.1968.1049908
Filename
1049908
Link To Document