• DocumentCode
    872777
  • Title

    Conductor admittance in transverse TEM filters and slow-wave structures

  • Author

    Kollberg, E.

  • Author_Institution
    Chalmers University of Technology, Research Laboratory of Electronics, Gothenburg, Sweden
  • Volume
    3
  • Issue
    7
  • fYear
    1967
  • fDate
    7/1/1967 12:00:00 AM
  • Firstpage
    294
  • Lastpage
    296
  • Abstract
    The admittance Y(¿) of a single rectangular conductor in a transverse TEM filter or slow-wave structure can be expressed in a series of mutual interaction terms with the neighbouring conductors and with the surrounding ground planes. The first four interaction terms are computed numerically and yield Y(¿) with about 1% accuracy.
  • Keywords
    mathematics; stability;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19670226
  • Filename
    4207279
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=872777