DocumentCode :
872975
Title :
Effect of fixed emission wavelength on threshold current of InGaAsP semiconductor laser diodes
Author :
O´Gorman, J. ; Levi, A.F.J.
Author_Institution :
AT&T Bell Labs., Murray Hill, NJ, USA
Volume :
28
Issue :
22
fYear :
1992
Firstpage :
2091
Lastpage :
2093
Abstract :
The authors demonstrate and quantify the extent to which a reduced variation of laser diode threshold current with temperature can be achieved by fixing lasing wavelength on the long wavelength side of the room temperature gain peak. This enhancement (T0=92 K) occurs at the expense of increased threshold current at low temperatures. Fixing the lasing wavelength on the short wavelength side of the room temperature gain peak to reduce dynamic spectral broadening occurring at high modulation rates leads to reduced T0 (=30 K) in comparison to Fabry-Perot laser diodes T0 (=42 K) made from the same material.
Keywords :
III-V semiconductors; gallium arsenide; gallium compounds; indium compounds; semiconductor lasers; InGaAsP; dynamic spectral broadening; fixed emission wavelength; high modulation rates; semiconductor laser diodes; threshold current;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19921341
Filename :
204601
Link To Document :
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