Title :
On TSC checkers for m-out-of-n codes
Author :
Dimakopoulos, V.V. ; Sourtziotis, G. ; Paschalis, A. ; Nikolos, D.
Author_Institution :
Dept. of Electr. & Comput. Eng., Victoria Univ., BC, Canada
fDate :
8/1/1995 12:00:00 AM
Abstract :
Paschalis et al. (1988) have given a structured method to design TSC m-out-of-2m code checkers suitable for VLSI implementation. In this correspondence we give sufficient conditions so that the method previously given can be used to design checkers for classes of m-out-of-n codes with n≠2m
Keywords :
error detection codes; logic testing; TSC checkers; VLSI implementation; code checkers; Circuit faults; Circuit testing; Costs; Design methodology; Electrical fault detection; Fault detection; Fault tolerance; Informatics; Sufficient conditions; Very large scale integration;
Journal_Title :
Computers, IEEE Transactions on
