Fault detection in CVS parity trees with application to strongly self-checking parity and two-rail checkers

Author

Jha, Niraj K.

Author_Institution

Dept. of Electr. Eng., Princeton Univ., NJ, USA

Volume

42

Issue

2

fYear

1993

fDate

2/1/1993 12:00:00 AM

Firstpage

179

Lastpage

189

Abstract

The problem of single stuck-at, stuck-open, and stuck-on fault detection in cascode voltage switch (CVS) parity trees is considered. The results are also applied to parity and two-rail checkers. It is shown that, if the parity tree consists of only differential cascode voltage switch (DCVS) EX-OR gates, then the test set consists of at most five vectors (in some cases only four vectors are required) for detecting all detectable single stuck-at, stuck-open, and stuck-on faults, independent of the number of primary inputs and the number of inputs to any EX-OR gate in the tree. If, however, only a single-ended output is desired from the tree, then the final gate will be a single-ended cascode voltage switch (SCVS) EX-OR gate, for which the test set has only eight vectors. For a strongly self-checking (SSC) CVS parity checker, the size of a test set consisting of only codewords is nine, whereas for an SSC CVS two-rail checker the size of a test set consisting of only codewords is at most five

Keywords

fault location; logic gates; logic testing; CVS parity trees; EX-OR gates; cascode voltage switch; differential cascode voltage switch; single stuck-at; single-ended cascode voltage switch; strongly self-checking parity; stuck-on fault detection; stuck-open; two-rail checkers; CMOS logic circuits; CMOS technology; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; MOS devices; Robustness; Switches; Voltage;

fLanguage

English

Journal_Title

Computers, IEEE Transactions on

Publisher

ieee

ISSN

0018-9340

Type

jour

DOI

10.1109/12.204791

Filename

204791