• DocumentCode
    873756
  • Title

    Notes on multiple input signature analysis

  • Author

    Kameda, Tiko ; Pilarski, Slawomir ; Ivanov, Andre

  • Author_Institution
    Sch. of Comput. Sci., Simon Fraser Univ., Burnaby, BC, Canada
  • Volume
    42
  • Issue
    2
  • fYear
    1993
  • fDate
    2/1/1993 12:00:00 AM
  • Firstpage
    228
  • Lastpage
    234
  • Abstract
    Many results regarding the probability of aliasing for multiple-input compactors have been derived under error assumptions that are not very realistic for VLSI circuits. Recently, the value of aliasing probability has been proven to tend to 2-k, where k is the number of binary memory elements of the linear compactor. This result is based on the assumption that the compactor is characterized by an irreducible polynomial and that the `no error´ vector has a probability different from zero. In these notes, the above result is generalized. More specifically, it is proved that it is valid if any two error vectors, neither of which needs to be the `no error´ vector, have probabilities of occurrence different from zero. To make the error model complete, the situation in which exactly one error vector has a probability different from zero is also considered. For the latter type of error distributions, the test lengths at which aliasing occurs are determined. Simple proofs for the results are provided; they are based on standard linear algebra notions and well-known theorems
  • Keywords
    built-in self test; feedback; logic testing; shift registers; VLSI circuits; aliasing; binary memory elements; error assumptions; error model; irreducible polynomial; multiple input signature analysis; multiple-input compactors; probability; standard linear algebra notions; Automata; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Compaction; Electrical fault detection; Fault detection; Test pattern generators; Vectors;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/12.204795
  • Filename
    204795