• DocumentCode
    873877
  • Title

    Investigating the effects of reduced size on the properties of ferroelectrics

  • Author

    Saad, Mohamed M. ; Baxter, Paul ; McAneney, Jonny ; Lookman, Akeela ; Sinnamon, Lesley J. ; Evans, Paul ; Schilling, Alina ; Adams, Tim ; Zhu, Xinhua ; Pollard, Robert J. ; Bowman, Robert M. ; Gregg, J. Marty ; Jung, Dong Jin ; Morrison, Finlay D. ; Scott

  • Author_Institution
    Dept. of Phys. & Astron., Queen´´s Univ. Belfast
  • Volume
    53
  • Issue
    12
  • fYear
    2006
  • fDate
    12/1/2006 12:00:00 AM
  • Firstpage
    2208
  • Lastpage
    2225
  • Abstract
    A series of experiments has been undertaken to understand more about the fundamental origin of the thickness-induced permittivity collapse often observed in conventional thin film ferroelectric heterostructures. The various experiments are discussed, highlighting the eventual need to examine permittivity collapse in thin film single crystal material. It has been seen that dielectric collapse is not a direct consequence of reduced size, and neither is it a consequence of unavoidable physics associated with the ferroelectric-electrode boundary. Research on three-dimensional shape-constrained ferroelectrics, emphasizing self-assembled structures based on nanoporous alumina templates and on FIB-milled single crystals, is also presented, and appears to represent an exciting area for ongoing research
  • Keywords
    ferroelectric thin films; nanoporous materials; permittivity; self-assembly; 3D shape-constrained ferroelectrics; FIB-milled single crystals; dielectric collapse; ferroelectric-electrode boundary; nanoporous alumina templates; permittivity collapse; self-assembled structures; thin film ferroelectric heterostructures; thin film single crystal material; Capacitors; Crystalline materials; Dielectric materials; Dielectric thin films; Ferroelectric materials; Geometry; Nanoporous materials; Permittivity; Physics; Polarization;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/TUFFC.2006.168
  • Filename
    4037256