Advanced fabrication and characterization of epitaxial ferroelectric thin films and multilayers

Author

Dawber, Matthew ; Lichtensteiger, Celine ; Paruch, Patrycja ; Triscone, Jean-Marc

Author_Institution

DPMC, Geneva Univ.

Volume

53

Issue

12

fYear

2006

fDate

12/1/2006 12:00:00 AM

Firstpage

2261

Lastpage

2269

Abstract

Understanding the behavior of ferroelectrics on the nanoscale level requires the production of materials of the highest quality and advanced characterization techniques for probing the fascinating properties of these systems with reduced dimensions. Here we give an overview of our recent achievements in this area, which includes the detailed study of the suppression of ferroelectricity in PbTiO₃ thin films, the fabrication of PbTiO₃/SrTiO₃ superlattices in which ferroelectricity shows some surprising behavior, and finally the manipulation of nanoscale ferroelectric domains using the atomic force microscope which leads to the precise analysis of domain wall creep and roughness in Pb(Zr,Ti)O₃ thin films

Keywords

atomic force microscopy; electric domain walls; epitaxial growth; ferroelectric thin films; ferroelectricity; lead compounds; nanotechnology; oxygen compounds; strontium compounds; superlattices; titanium compounds; zirconium compounds; Pb(ZrTi)O₃; PbTiO₃; PbTiO₃-SrTiO₃; atomic force microscope; domain wall creep; domain wall roughness; epitaxial ferroelectric thin films; ferroelectricity; multilayers; nanoscale ferroelectric domains; superlattices; Atomic force microscopy; Atomic layer deposition; Fabrication; Ferroelectric materials; Magnetic flux; Magnetic superlattices; Metallic superlattices; Nonhomogeneous media; Sputtering; Transistors;

fLanguage

English

Journal_Title

Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on

Publisher

ieee

ISSN

0885-3010

Type

jour

DOI

10.1109/TUFFC.2006.171

Filename

4037259