Abstract :
A method is described which permits the determination of the complex dielectric constant, epsilon* = epsilonoke(l-j tan deltae), and the complex permeability, µ* = µokm (l-j tan deltam), using free space transmission and reflection from a plane sheet of the sample dielectric. The procedure represents an extension of that used at optical frequencies. Differences arise however, due to the fact that the assumptions of km = 1 and tan deltam = 0, which are made in the optical theory, are not always valid at millimeter wavelengths.