DocumentCode :
873981
Title :
Optical Methods for the Measurement of Complex Dielectric and Magnetic Constants at Centimeter and Millimeter Wavelengths
Author :
Talpey, T.E.
Volume :
2
Issue :
3
fYear :
1954
fDate :
9/1/1954 12:00:00 AM
Firstpage :
1
Lastpage :
12
Abstract :
A method is described which permits the determination of the complex dielectric constant, epsilon* = epsilonoke(l-j tan deltae), and the complex permeability, µ* = µokm (l-j tan deltam), using free space transmission and reflection from a plane sheet of the sample dielectric. The procedure represents an extension of that used at optical frequencies. Differences arise however, due to the fact that the assumptions of km = 1 and tan deltam = 0, which are made in the optical theory, are not always valid at millimeter wavelengths.
Keywords :
Dielectric constant; Dielectric losses; Dielectric measurements; Frequency; Millimeter wave measurements; Millimeter wave technology; Optical attenuators; Optical reflection; Permeability; Wavelength measurement;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, Transactions of the IRE Professional Group on
Publisher :
ieee
ISSN :
0276-1173
Type :
jour
DOI :
10.1109/TMTT.1954.1124880
Filename :
1124880
Link To Document :
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