DocumentCode

874050

Title

Transistor-surface analysis after secondary breakdown

Author

Hakim, E.B.

Author_Institution

U.S. Army Electronics Control, Fort Monmouth, N.J.

Volume

53

Issue

9

fYear

1965

Firstpage

1226

Lastpage

1226

Keywords

Aging; Aluminum; Electric breakdown; Electrons; Gold; Optical devices; Optical variables control; Silicon; Stimulated emission; Surface resistance;

fLanguage

English

Journal_Title

Proceedings of the IEEE

Publisher

ieee

ISSN

0018-9219

Type

jour

DOI

10.1109/PROC.1965.4170

Filename

1446100