DocumentCode
874061
Title
Microwave leakage-induced frequency shifts in the primary frequency Standards NIST-F1 and IEN-CSF1
Author
Shirley, Jon H. ; Levi, Filippo ; Heavner, Thomas P. ; Calonico, Davide ; Yu, Dai-Hyuk ; Jefferts, Steve R.
Author_Institution
Div. of Time & Frequency, NIST, Boulder, CO
Volume
53
Issue
12
fYear
2006
fDate
12/1/2006 12:00:00 AM
Firstpage
2376
Lastpage
2385
Abstract
In atomic fountain primary frequency standards, the atoms ideally are subjected to microwave fields resonant with the ground-state, hyperfine splitting only during the two pulses of Ramsey´s separated oscillatory field measurement scheme. As a practical matter, however, stray microwave fields can be present that shift the frequency of the central Ramsey fringe and, therefore, adversely affect the accuracy of the standard. We investigate these uncontrolled stray fields here and show that the frequency errors can be measured, and indeed even the location within the standard determined by the behavior of the measured frequency with respect to microwave power in the Ramsey cavity. Experimental results that agree with the theory are presented as well
Keywords
atomic clocks; caesium; cavity resonators; frequency standards; IEN-CSF1 standard; NIST-F1 standard; Ramsey cavity; atomic fountain; central Ramsey fringe; frequency errors; ground state; hyperfine splitting; microwave leakage-induced frequency shift; microwave power; primary frequency standards; separated oscillatory field measurement; stray microwave field; Atomic beams; Atomic measurements; Frequency measurement; Masers; Measurement standards; Microwave devices; Microwave measurements; Power measurement; Pulse measurements; Resonance;
fLanguage
English
Journal_Title
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher
ieee
ISSN
0885-3010
Type
jour
DOI
10.1109/TUFFC.2006.186
Filename
4037274
Link To Document