• DocumentCode
    87410
  • Title

    Opportunities for shear energy scaling in bulk acoustic wave resonators

  • Author

    Jose, Sneha ; Hueting, Raymond J. E.

  • Author_Institution
    Quality & Reliability, NXP Semicond., Nijmegen, Netherlands
  • Volume
    61
  • Issue
    10
  • fYear
    2014
  • fDate
    Oct. 2014
  • Firstpage
    1720
  • Lastpage
    1728
  • Abstract
    An important energy loss contribution in bulk acoustic wave resonators is formed by so-called shear waves, which are transversal waves that propagate vertically through the devices with a horizontal motion. In this work, we report for the first time scaling of the shear-confined spots, i.e., spots containing a high concentration of shear wave displacement, controlled by the frame region width at the edge of the resonator. We also demonstrate a novel methodology to arrive at an optimum frame region width for spurious mode suppression and shear wave confinement. This methodology makes use of dispersion curves obtained from finite-element method (FEM) eigenfrequency simulations for arriving at an optimum frame region width. The frame region optimization is demonstrated for solidly mounted resonators employing several shear wave optimized reflector stacks. Finally, the FEM simulation results are compared with measurements for resonators with Ta2O5/ SiO2 stacks showing suppression of the spurious modes.
  • Keywords
    acoustic resonators; bulk acoustic wave devices; eigenvalues and eigenfunctions; elastic waves; finite element analysis; silicon compounds; tantalum compounds; FEM eigenfrequency simulations; Ta2O5-SiO2; Ta2O5-SiO2 stacks; bulk acoustic wave resonators; device horizontal motion; dispersion curves; energy loss contribution; finite element method; frame region width; resonator edge; shear confined spot scaling; shear energy scaling; shear wave confinement; shear wave displacement; shear waves; solidly mounted resonators; spurious mode suppression; vertically propagating transversal waves; Acoustics; Analytical models; Boundary conditions; Dispersion; Erbium; Finite element analysis; Resonant frequency;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/TUFFC.2014.006447
  • Filename
    6910382