• DocumentCode
    874569
  • Title

    Noise in integrated-circuit transistors

  • Author

    Brodersen, Arthur J. ; Chenette, Eugene R. ; Jaeger, Richard C.

  • Volume
    5
  • Issue
    2
  • fYear
    1970
  • fDate
    4/1/1970 12:00:00 AM
  • Firstpage
    63
  • Lastpage
    66
  • Abstract
    Recent noise measurement from 1 Hz to 5 kHz on integrated-circuit transistors have shown an anomalous burst noise in addition to the usual noise spectrum. The terminal characteristics of the burst noise are presented and a phenomenological noise-circuit model is developed.
  • Keywords
    Bipolar transistors; Integrated circuits; Noise; bipolar transistors; integrated circuits; noise; Circuit noise; Electrical resistance measurement; Electron tubes; Integrated circuit measurements; Integrated circuit noise; Laboratories; Noise generators; Noise measurement; Pulse measurements; Transistors;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.1970.1050072
  • Filename
    1050072
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=874569