DocumentCode

874591

Title

Low-level microwave limiting utilizing impact ionization in bulk germanium at 4.2°K

Author

Heinz, W.W. ; Okwit, S.

Author_Institution

Airborne Instruments Lab., A Division of Cutler-Hammer, Melville, N.Y.

Volume

53

Issue

9

fYear

1965

Firstpage

1274

Lastpage

1274

Keywords

Bandwidth; Conductivity; Electric breakdown; Frequency; Garnets; Germanium; Impact ionization; Insertion loss; Microwave devices; Semiconductor impurities;

fLanguage

English

Journal_Title

Proceedings of the IEEE

Publisher

ieee

ISSN

0018-9219

Type

jour

DOI

10.1109/PROC.1965.4223

Filename

1446153