DocumentCode
874604
Title
Transistor characterization by effective large-signal two-port parameters
Author
Houselander, L.S. ; Chow, H.Y. ; Spence, R.
Volume
5
Issue
2
fYear
1970
fDate
4/1/1970 12:00:00 AM
Firstpage
77
Lastpage
79
Abstract
A method is proposed of transistor characterization by effective large-signal parameters measured under the condition of sinusoidal port voltages. It is anticipated that this form of active-device description will find application in the computer design of narrow-frequency-band constant-amplitude nearly sinusoidal amplifiers and oscillators.
Keywords
Semiconductor device models; Transistors; semiconductor device models; transistors; Admittance; Analog memory; Application software; Circuit analysis; Electrons; Frequency; MOSFET circuits; Microwave transistors; Oscillators; Voltage;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.1970.1050076
Filename
1050076
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