• DocumentCode
    874716
  • Title

    On an asymptotically optimal adaptive classifier design criterion

  • Author

    Lee, Wei-Tsih ; Tenorio, Manoel Fernando

  • Author_Institution
    Sch. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA
  • Volume
    15
  • Issue
    3
  • fYear
    1993
  • fDate
    3/1/1993 12:00:00 AM
  • Firstpage
    312
  • Lastpage
    318
  • Abstract
    A new approach for estimating classification errors is presented. In the model, there are two types of classification error: empirical and generalization error. The first is the error observed over the training samples, and the second is the discrepancy between the error probability and empirical error. In this research, the Vapnik and Chervonenkis dimension (VCdim) is used as a measure for classifier complexity. Based on this complexity measure, an estimate for generalization error is developed. An optimal classifier design criterion (the generalized minimum empirical error criterion (GMEE)) is used. The GMEE criterion consists of two terms: the empirical and the estimate of generalization error. As an application, the criterion is used to design the optimal neural network classifier. A corollary to the Γ optimality of neural-network-based classifiers is proven. Thus, the approach provides a theoretic foundation for the connectionist approach to optimal classifier design. Experimental results to validate this approach
  • Keywords
    error analysis; estimation theory; image recognition; neural nets; optimisation; Vapnik-Chervonenkis dimension; asymptotically optimal adaptive classifier; classification error estimation; classifier complexity; design criterion; error probability; generalization error; generalized minimum empirical error criterion; image recognition; neural network classifier; Computational efficiency; Convergence; Error probability; Estimation error; Neural networks; Pixel; Speech recognition; Sufficient conditions; Training data;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/34.204915
  • Filename
    204915