DocumentCode
874910
Title
Sudden Change of Electrical Characteristics at Lasing Threshold of a Semiconductor Laser
Author
Feng, L.F. ; Wang, C.D. ; Cong, H.X. ; Zhu, C.Y. ; Wang, Jun ; Xie, X.S. ; Lu, C.Z. ; Zhang, G.Y.
Author_Institution
Dept. of Appl. Phys., Tianjin Univ.
Volume
43
Issue
6
fYear
2007
fDate
6/1/2007 12:00:00 AM
Firstpage
458
Lastpage
461
Abstract
Accurate forward electrical characteristics of multiquantum-well (MQW) lasers have been measured using ac admittance measurements together with dc I-V plot. The synchronous step offsets of apparent conductance, apparent capacitance, junction voltage, series resistance, and ideality factor at the onset of lasing were observed for the first time. With this effect, the lasing threshold can be deduced immediately by the LCR Meter. It is also found that the junction voltage jumps abruptly to a saturated value at the onset of lasing, and the starting and end points of jumping exactly correspond to the maximum of the second derivative of lasing power with respect to current and the kink point of the first derivative, respectively. All of the phenomena may help to verify and improve existing semiconductor laser models. In addition, negative capacitance effect in LDs was observed
Keywords
electro-optical effects; integrated optoelectronics; semiconductor lasers; ac admittance measurements; apparent capacitance; apparent conductance; forward electrical characteristics; ideality factor; junction voltage; lasing threshold; multiquantum-well lasers; negative capacitance effect; optoelectronic device; semiconductor laser; semiconductor laser models; series resistance; Admittance measurement; Capacitance; Electric resistance; Electric variables; Electric variables measurement; Electrical resistance measurement; Laser transitions; Quantum well devices; Semiconductor lasers; Voltage; Capacitance; ideality factor; junction voltage; multiquantum-well (MQW) laser; negative capacitance (NC); series resistance; sudden change;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/JQE.2007.895663
Filename
4207489
Link To Document