DocumentCode

875036

Title

Single Event Upset Rate Predictions for Complex Logic Systems

Author

Diehl-Nagle, S.E. ; Vinson, J.E. ; Peterson, E.L.

Author_Institution

North Carolina State University Raleigh, NC 27695-7911

Volume

31

Issue

6

fYear

1984

Firstpage

1132

Lastpage

1138

Keywords

Combinational circuits; DRAM chips; Decoding; Latches; Logic arrays; Logic circuits; Logic devices; Random access memory; Read-write memory; Single event upset;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.1984.4333470

Filename

4333470