• DocumentCode
    875467
  • Title

    Prompt and Total Dose Response of Hard 4k and 16k CMOS Static Random Access Memories (SRAMs)

  • Author

    Witteles, A.A. ; Volmerange, H. ; Davidson, H. ; Yue, H. ; Jennings, R. ; Brucker, G.J.

  • Author_Institution
    TRW Inc. One Space Park, Redondo Beach, California 90278
  • Volume
    31
  • Issue
    6
  • fYear
    1984
  • Firstpage
    1354
  • Lastpage
    1357
  • Keywords
    CMOS memory circuits; CMOS process; Pulse width modulation inverters; Radiation hardening; Random access memory; Resistors; Rivers; SRAM chips; Single event upset; Testing;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1984.4333510
  • Filename
    4333510
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=875467