• DocumentCode
    875776
  • Title

    Thermal feedback in silicon j.f.e.t.s operating at low temperatures

  • Author

    Churchill, M.J. ; Lauritzen, P.A.

  • Volume
    6
  • Issue
    4
  • fYear
    1971
  • fDate
    8/1/1971 12:00:00 AM
  • Firstpage
    265
  • Lastpage
    267
  • Abstract
    Thermal feedback modifies the d.c. and a.c. characteristics at temperatures where carrier freeze-out occurs. Data for common source operation are analyzed using the thermal feedback theory of Mueller (abstr. B15319 of 1964).
  • Keywords
    Carrier density; Field effect transistors; Thermal effects; carrier density; field effect transistors; thermal effects; Charge carrier density; Feedback; Frequency; Impedance; JFETs; Power dissipation; Silicon; Temperature dependence; Thermal resistance; Voltage;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.1971.1050178
  • Filename
    1050178
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=875776