DocumentCode :
876001
Title :
Transit time effects in gaseous and solid-state devices
Author :
Wadhwa, R.P.
Volume :
53
Issue :
11
fYear :
1965
Firstpage :
1738
Lastpage :
1739
Keywords :
Bandwidth; Chromium; Gaussian processes; High-K gate dielectrics; Isolators; Magnetic field measurement; Masers; Pins; Solid state circuits; Temperature sensors;
fLanguage :
English
Journal_Title :
Proceedings of the IEEE
Publisher :
ieee
ISSN :
0018-9219
Type :
jour
DOI :
10.1109/PROC.1965.4355
Filename :
1446285
Link To Document :
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