DocumentCode
876115
Title
Precision of Independently Based Gain and Offset Error of an ADC Using the Histogram Method
Author
Alegria, F. Corrêa ; Serra, A. Cruz
Author_Institution
Inst. de Telecomun./Inst. Super. Tecnico, Tech. Univ. of Lisbon, Lisbon
Volume
58
Issue
3
fYear
2009
fDate
3/1/2009 12:00:00 AM
Firstpage
512
Lastpage
521
Abstract
Two of the parameters that are determined when testing an analog-to-digital converter (ADC) are the gain and offset errors. One of the ways to define these two parameters is called ldquoindependently based.rdquo In this paper, we derive the precision of the gain and offset errors estimated with the histogram test method affected by additive noise.
Keywords
AWGN; analogue-digital conversion; circuit noise; circuit testing; error analysis; ADC gain; AWGN; additive white Gaussian noise; analog-to-digital converter testing; histogram test method; independently-based gain; offset error estimation; Analog-to-digital converter (ADC); gain; histogram; offset error; precision;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.2008.2005261
Filename
4636730
Link To Document