Title :
Measurement of transfer efficiency of charge-coupled devices
Author :
Berger, Josef ; Brugler, J. Stephen ; Melen, R.
fDate :
12/1/1971 12:00:00 AM
Abstract :
A simple method for measuring the transfer efficiency of charge- coupled devices is described. It is based on the effect of charge pumping in MOS devices and has the advantages that (1) it requires a simple device and simple pulsing circuitry; and (2) the lost charge is evaluated from d.c. measurement.
Keywords :
Frequency convertors; frequency convertors; Charge measurement; Charge pumps; Circuits; Current measurement; Loss measurement; MOS devices; Measurement techniques; Pulse shaping methods; Q measurement; Voltage;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.1971.1050220
