• DocumentCode
    876587
  • Title

    Physical origin of the negative output resistance of heterojunction bipolar transistors

  • Author

    Dagli, Nadir

  • Author_Institution
    Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
  • Volume
    9
  • Issue
    3
  • fYear
    1988
  • fDate
    3/1/1988 12:00:00 AM
  • Firstpage
    113
  • Lastpage
    115
  • Abstract
    An analytical expression for the small-signal output impedance of a heterojunction bipolar transistor (HBT) is obtained based on device physics. It is shown that, when external parasitics are sufficiently reduced so that intrinsic time delays become the dominant limitations to high-frequency performance, the output resistance can be negative over certain bands of frequencies due to transit time delays. Under such conditions amplifiers with high gains can be designed at frequencies where the power gain of the device due to conventional transistor action is very low, and power gain vs. frequency characteristics of the device can be drastically different from the traditional 6-dB/octave rolloff. Analytical expressions that can be used in the design of these devices are derived to obtain the full benefit of negative output resistance.
  • Keywords
    bipolar transistors; negative resistance; power transistors; device physics; external parasitics; frequency characteristics; heterojunction bipolar transistors; intrinsic time delays; negative output resistance; output resistance; power gain; small-signal output impedance; transistor action; transit time delays; Bipolar transistors; Circuit simulation; Delay effects; Electron emission; Equivalent circuits; Frequency; Heterojunction bipolar transistors; High power amplifiers; Impedance; Physics;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/55.2059
  • Filename
    2059