DocumentCode
876587
Title
Physical origin of the negative output resistance of heterojunction bipolar transistors
Author
Dagli, Nadir
Author_Institution
Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
Volume
9
Issue
3
fYear
1988
fDate
3/1/1988 12:00:00 AM
Firstpage
113
Lastpage
115
Abstract
An analytical expression for the small-signal output impedance of a heterojunction bipolar transistor (HBT) is obtained based on device physics. It is shown that, when external parasitics are sufficiently reduced so that intrinsic time delays become the dominant limitations to high-frequency performance, the output resistance can be negative over certain bands of frequencies due to transit time delays. Under such conditions amplifiers with high gains can be designed at frequencies where the power gain of the device due to conventional transistor action is very low, and power gain vs. frequency characteristics of the device can be drastically different from the traditional 6-dB/octave rolloff. Analytical expressions that can be used in the design of these devices are derived to obtain the full benefit of negative output resistance.
Keywords
bipolar transistors; negative resistance; power transistors; device physics; external parasitics; frequency characteristics; heterojunction bipolar transistors; intrinsic time delays; negative output resistance; output resistance; power gain; small-signal output impedance; transistor action; transit time delays; Bipolar transistors; Circuit simulation; Delay effects; Electron emission; Equivalent circuits; Frequency; Heterojunction bipolar transistors; High power amplifiers; Impedance; Physics;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/55.2059
Filename
2059
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