مرکز منطقه ای اطلاع رساني علوم و فناوري - IEEE Transactions on Device and Material Reliability on "Nonvolatile Memory Reliability"

DocumentCode :

877283

Title :

IEEE Transactions on Device and Material Reliability on "Nonvolatile Memory Reliability"

Volume :

Issue :

fYear :

2004

Firstpage :

113

Lastpage :

113

Abstract :

Prospective authors are requested to submit new, unpublished manuscripts for inclusion in the upcoming event described in this call for papers.

fLanguage :

English

Journal_Title :

Electron Device Letters, IEEE

Publisher :

ieee

ISSN :

0741-3106

Type :

jour

DOI :

10.1109/LED.2004.823962

Filename :

1263645

Link To Document :