Title :
Total Dose Effects in Op-Amps With Compensated Input Stages
Author :
Johnston, A.H. ; Rax, B.G. ; Thorbourn, D.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA
Abstract :
This paper discusses total dose damage in operational amplifiers with compensated input stages. The impact of this design approach on unit-to-unit variability of radiation damage is examined, along with hardness assurance methods that can be used to bound the radiation behavior. Data is included for an unusually large sample (100 devices) of one device type. Half of those devices were subjected to burn-in before irradiation to investigate the effect of burn-in on radiation response.
Keywords :
operational amplifiers; radiation hardening (electronics); burn-in effect; compensated input stages; dose damage; hardness assurance method; operational amplifier; radiation damage; radiation response; total dose effects; Circuits; Degradation; Impedance matching; Ionization; Low voltage; Mirrors; Operational amplifiers; Propulsion; Radiation effects; Space technology; Hardness assurance; operational amplifier; space radiation effects; total dose;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2008.2000889
