• DocumentCode
    87761
  • Title

    Conceal Time Delay Signature of Chaos in Semiconductor Lasers With Dual-Path Injection

  • Author

    Shui Ying Xiang ; Wei Pan ; Ai Jun Wen ; Nian Qiang Li ; Li Yue Zhang ; Lei Shang ; Hui Xing Zhang

  • Author_Institution
    State Key Lab. of Integrated Service Networks, Xi´dian Univ., Xi´an, China
  • Volume
    25
  • Issue
    14
  • fYear
    2013
  • fDate
    15-Jul-13
  • Firstpage
    1398
  • Lastpage
    1401
  • Abstract
    The time delay (TD) signatures of chaotic signals in semiconductor lasers (SLs) with dual-path injection (DPI) are investigated numerically and experimentally based on the autocorrelation function and the permutation entropy function, and are compared with those for chaotic signals in SLs with single-path injection (SPI). Both the intensity and phase chaos are considered. The regions of injection strength and frequency detuning contributing to TD concealment are identified. The optimal selection of injection delays for the DPI case is also suggested. It is found that, for both intensity and phase chaos, the TD signature for the DPI case can be better concealed in wider parameter regions than that for the SPI case, which is highly desirable for security-enhanced chaotic communication systems as well as high-speed random number generators based on chaotic SLs.
  • Keywords
    delays; laser tuning; numerical analysis; optical chaos; optical communication equipment; semiconductor lasers; DPI; TD concealment; autocorrelation function; chaotic SL; chaotic signals; conceal time delay signature; dual-path injection; frequency detuning; high-speed random number generators; injection delays; injection strength; intensity chaos; numerical analysis; optimal selection; permutation entropy function; phase chaos; security-enhanced chaotic communication systems; semiconductor lasers; Semiconductor lasers; chaos; dual-path injection; time-delay signature;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2013.2266133
  • Filename
    6523130