DocumentCode
877653
Title
Carrier distribution, gain, and lasing in 1.3-μm InAs-InGaAs quantum-dot lasers
Author
Dikshit, A.A. ; Pikal, J.M.
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Wyoming, Laramie, WY, USA
Volume
40
Issue
2
fYear
2004
Firstpage
105
Lastpage
112
Abstract
In this paper, we present the results of a theoretical model built to describe the temperature-dependent lasing characteristics of InAs-InGaAs quantum-dot (QD) lasers operating at 1.3 μm. From the model, we find that traditional carrier distribution theories are inadequate to describe the performance of these lasers. We therefore introduce an improved model that allows for both free carriers and excitons in the dots. The new model provides threshold current and characteristic temperature T0 values that are in good agreement with experimental data. The results of our modeling reveal that, while it is the excitons that mainly contribute to the gain, the ratio of excitons to free carriers significantly affect the T0 of QD lasers. Our model results also indicate that the wetting layer current plays little role in QD laser performance. In addition, the model correctly predicts other experimental observations such as; increased T0 for increased number of QD layers and p-doped structures, and the oscillatory behavior of T0, lending further credibility to the model.
Keywords
III-V semiconductors; excitons; gallium compounds; indium compounds; laser theory; quantum dot lasers; semiconductor device models; semiconductor optical amplifiers; semiconductor quantum dots; 1.3 mum; InAs-InGaAs; InAs-InGaAs quantum-dot lasers; QD laser performance; carrier distribution; excitons; free carriers; gain; oscillatory behavior; p-doped structures; temperature-dependent lasing; traditional carrier distribution theories; wetting layer current; Carrier confinement; Excitons; Laser modes; Laser theory; Predictive models; Quantum dot lasers; Quantum dots; Semiconductor lasers; Temperature dependence; Threshold current;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/JQE.2003.821532
Filename
1263676
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