• DocumentCode
    877709
  • Title

    Wide-bandgap epitaxial heterojunction windows for silicon solar cells

  • Author

    Landis, Geoffrey A. ; Loferski, Joseph J. ; Beaulieu, Roland ; Sekula-Moise, P.A. ; Vernon, Stanley M. ; Spitzer, Mark B. ; Keavney, Christopher J.

  • Author_Institution
    Brown Univ., Providence, RI, USA
  • Volume
    37
  • Issue
    2
  • fYear
    1990
  • fDate
    2/1/1990 12:00:00 AM
  • Firstpage
    372
  • Lastpage
    381
  • Abstract
    It is shown that the efficiency of a solar cell can be improved if minority carriers are confined by use of a wide-bandgap heterojunction window. For silicon (lattice constant a=5.43 Å), nearly lattice-matched wide-bandgap materials are ZnS (a=5.41 Å) and GaP (a=5.45 Å). Isotype n-n heterojunctions of both ZnS/Si and GaP/Si were grown on silicon n-p homojunction solar cells. Successful deposition processes used were metalorganic chemical vapor deposition (MO-CVD) for GaP and ZnS, and vacuum evaporation of ZnS. Planar (100) and (111) and texture-etched ((111) faceted) surfaces were used. A decrease in minority-carrier surface recombination compared to a bare surface was seen from increased short-wavelength spectral response, increased open-circuit voltage, and reduced dark saturation current, with no degradation of the minority carrier diffusion length
  • Keywords
    III-V semiconductors; chemical vapour deposition; elemental semiconductors; gallium compounds; semiconductor epitaxial layers; semiconductor junctions; semiconductor technology; solar cells; vacuum deposition; vapour phase epitaxial growth; zinc compounds; GaP-Si; MOCVD; Si; Si solar cells; ZnS-Si; dark saturation current; deposition processes; efficiency; epitaxial heterojunction windows; heteroepitaxy; lattice constants; lattice matching; metalorganic chemical vapor deposition; minority carrier confinement; minority carrier diffusion length; minority-carrier surface recombination; n-n heterojunctions; n-p homojunction solar cells; open-circuit voltage; semiconductors; short-wavelength spectral response; vacuum evaporation; wide-bandgap heterojunction window; wide-bandgap materials; Carrier confinement; Chemical vapor deposition; Degradation; Heterojunctions; Lattices; Photovoltaic cells; Silicon; Surface texture; Voltage; Zinc compounds;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.46369
  • Filename
    46369