DocumentCode
877709
Title
Wide-bandgap epitaxial heterojunction windows for silicon solar cells
Author
Landis, Geoffrey A. ; Loferski, Joseph J. ; Beaulieu, Roland ; Sekula-Moise, P.A. ; Vernon, Stanley M. ; Spitzer, Mark B. ; Keavney, Christopher J.
Author_Institution
Brown Univ., Providence, RI, USA
Volume
37
Issue
2
fYear
1990
fDate
2/1/1990 12:00:00 AM
Firstpage
372
Lastpage
381
Abstract
It is shown that the efficiency of a solar cell can be improved if minority carriers are confined by use of a wide-bandgap heterojunction window. For silicon (lattice constant a =5.43 Å), nearly lattice-matched wide-bandgap materials are ZnS (a =5.41 Å) and GaP (a =5.45 Å). Isotype n-n heterojunctions of both ZnS/Si and GaP/Si were grown on silicon n-p homojunction solar cells. Successful deposition processes used were metalorganic chemical vapor deposition (MO-CVD) for GaP and ZnS, and vacuum evaporation of ZnS. Planar (100) and (111) and texture-etched ((111) faceted) surfaces were used. A decrease in minority-carrier surface recombination compared to a bare surface was seen from increased short-wavelength spectral response, increased open-circuit voltage, and reduced dark saturation current, with no degradation of the minority carrier diffusion length
Keywords
III-V semiconductors; chemical vapour deposition; elemental semiconductors; gallium compounds; semiconductor epitaxial layers; semiconductor junctions; semiconductor technology; solar cells; vacuum deposition; vapour phase epitaxial growth; zinc compounds; GaP-Si; MOCVD; Si; Si solar cells; ZnS-Si; dark saturation current; deposition processes; efficiency; epitaxial heterojunction windows; heteroepitaxy; lattice constants; lattice matching; metalorganic chemical vapor deposition; minority carrier confinement; minority carrier diffusion length; minority-carrier surface recombination; n-n heterojunctions; n-p homojunction solar cells; open-circuit voltage; semiconductors; short-wavelength spectral response; vacuum evaporation; wide-bandgap heterojunction window; wide-bandgap materials; Carrier confinement; Chemical vapor deposition; Degradation; Heterojunctions; Lattices; Photovoltaic cells; Silicon; Surface texture; Voltage; Zinc compounds;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.46369
Filename
46369
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