• DocumentCode
    877795
  • Title

    BPW34 Commercial p-i-n Diodes for High-Level 1-MeV Neutron Equivalent Fluence Monitoring

  • Author

    Ravotti, Federico ; Glaser, Maurice ; Moll, Michael ; Saigné, Frédéric

  • Author_Institution
    Phys. Dept., CERN, Geneva
  • Volume
    55
  • Issue
    4
  • fYear
    2008
  • Firstpage
    2133
  • Lastpage
    2140
  • Abstract
    The BPW34 p-i-n diode was characterized at CERN in view of its utilization as radiation monitor at the LHC to cover the broad 1-MeV neutron equivalent fluence (Phieq) range expected for the LHC machine and experiments during operation. Electrical measurements for both forward and reverse bias were used to characterize the device and to understand its behavior under irradiation. When the device is powered forward, a sensitivity to fast hadrons for Phieq > 2 times1012 cm-2 has been observed. With increasing particle fluences the forward I- V characteristics of the diode shifts towards higher voltages. At Phieq > 3times1013 cm-2, the forward characteristic starts to bend back assuming a thyristor-like behavior. An explanation for this phenomenon is given in this article. Finally, detailed radiation-response curves for the forward bias-operation and annealing studies of the diode´s forward voltage are presented for proton, neutron and gamma irradiation.
  • Keywords
    annealing; gamma-ray effects; neutron detection; neutron effects; p-i-n diodes; particle beam diagnostics; proton effects; radiation monitoring; BPW34 p-i-n diodes; annealing; commercial p-i-n diodes; electron volt energy 1 MeV; forward bias-operation; gamma irradiation; high-level fluence monitoring; neutron equivalent fluence monitoring; neutron irradiation; proton irradiation; radiation monitor; radiation-response curves; Annealing; Condition monitoring; Electric variables measurement; Large Hadron Collider; Neutrons; P-i-n diodes; PIN photodiodes; Protons; Radiation monitoring; Voltage; p-i-n diodes; Accelerators; particle beams; radiation damage; radiation monitoring;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2008.2000765
  • Filename
    4636908