Title :
Simple graphical method to determine line reflections between high-speed-logic integrated circuits
Author :
Abedel-Latif, M. ; Strutt, M.J.O.
Author_Institution :
Swiss Federal Institute of Technology, Department of Advanced Electrical Engineering, Zÿrich, Switzerland
Abstract :
Pulse-shape variations on a line connecting two high-speed-logic integrated circuits due to reflections are determined graphically using Bergeron´s theory. Different line lengths with different characteristic impedances have been tested. Reflection effects on the circuit noise immunity are studied. Theory and measurements have shown good agreement.
Keywords :
digital integrated circuits; integrated circuits; logic circuits; transmission line theory;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19680387
