DocumentCode
87844
Title
The Role of Neutron Scattering in Magnetic Storage Materials Research
Author
Callori, Sara J. ; Klose, Felix
Author_Institution
Bragg Inst., Australian Nucl. Sci. & Technol. Organ., Lucas Heights, NSW, Australia
Volume
50
Issue
7
fYear
2014
fDate
Jul-14
Firstpage
1
Lastpage
7
Abstract
As the demand for highly functional magnetic storage materials grows, the need to understand the basic physical properties behind these materials has become key to engineering storage devices. Neutron scattering techniques provide a way to probe the magnetic properties of potential memory materials. The highlighted techniques, polarized neutron reflectometry, small angle neutron scattering, and neutron diffraction, are sensitive to not only nuclear but also magnetic structure and are capable of investigating a large range of real space length scales. In this paper, we review recent research on magnetic thin films and layered systems with potential for storage applications. We focus on several important aspects of layered magnetic memory devices, including exchange bias, interfaces and interactions between layers, and magnetic reversal.
Keywords
exchange interactions (electron); magnetic storage; magnetic structure; magnetic thin films; neutron diffraction; engineering storage devices; exchange bias; high functional magnetic storage materials; layered magnetic memory devices; magnetic properties; magnetic reversal; magnetic structure; magnetic thin films; memory materials; neutron diffraction; polarized neutron reflectometry; small angle neutron scattering techniques; Frequency modulation; Magnetic domains; Materials; Neutrons; Perpendicular magnetic anisotropy; Scattering; Magnetic materials; magnetic memory; magnetic thin films; neutron scattering;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.2014.2302448
Filename
6851278
Link To Document