Title :
Accurate single-event-transient analysis via zero-delay logic simulation
Author :
Violante, Massimo
Author_Institution :
Dipt. di Automatica e Informatica, Politecnico di Torino, Italy
Abstract :
We describe an approach for analyzing single-event transients (SETs) in combinational circuits. The approach analyzes SETs via zero-delay simulation with the same accuracy of timing simulators, but with a speedup of three orders of magnitude.
Keywords :
combinational circuits; radiation hardening (electronics); semiconductor storage; accurate single-event-transient analysis; combinational circuits; speedup; timing simulators; zero-delay logic simulation; zero-delay simulation; Analytical models; Circuit analysis; Circuit faults; Circuit simulation; Circuit topology; Combinational circuits; Fault diagnosis; Logic; Timing; Transient analysis;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2003.820729
