Title :
Applicability of circuit macromodeling to analog single-event transient analysis
Author :
Boulghassoul, Y. ; Rowe, J.D. ; Massengill, L.W.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Vanderbilt Univ., Nashville, TN, USA
Abstract :
We have evaluated the applicability of vendor-supplied analog circuit macromodels to single-event transient (SET) analyses. Our findings demonstrate that macromodeling is very effective for system-level SET investigations; yet it is inadequate to address details of SET initiation at the IC level. Study of both dc and transient applications show that the circuitry peripheral to the ion strike location can be macromodeled and still retain an excellent ability to accurately transmit propagating voltage transients.
Keywords :
frequency response; integrated circuit modelling; radiation hardening (electronics); transients; analog single-event transient analysis; circuit macromodeling; circuitry peripheral; ion strike location; propagating voltage transients; single-event transient analyses; vendor-supplied analog circuit macromodels; Analog circuits; Analytical models; Circuit simulation; Circuit testing; Integrated circuit modeling; Integrated circuit testing; Laser modes; Operational amplifiers; Optical propagation; Transient analysis;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2003.821393