• DocumentCode
    879814
  • Title

    Normalized low-level characteristics of a saturated transistor

  • Author

    Bilotti, A.

  • Volume
    54
  • Issue
    3
  • fYear
    1966
  • fDate
    3/1/1966 12:00:00 AM
  • Firstpage
    405
  • Lastpage
    407
  • Keywords
    Capacitors; Degradation; Integrated circuit interconnections; Power generation; Power system harmonics; Radio frequency; Resistors; Semiconductor diodes; Thin film circuits; Varactors;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1966.4712
  • Filename
    1446642