• DocumentCode
    880089
  • Title

    Correlation of neutron dosimetry using a silicon equivalent proportional counter microdosimeter and SRAM SEU cross sections for eight neutron energy spectra

  • Author

    Gersey, B. ; Wilkins, R. ; Huff, H. ; Dwivedi, R.C. ; Takala, B. ; Donnell, J.O. ; Wender, S.A. ; Singleterry, Robert C., Jr.

  • Author_Institution
    NASA Center for Appl. Radiat. Res., Prairie View A&M Univ., TX, USA
  • Volume
    50
  • Issue
    6
  • fYear
    2003
  • Firstpage
    2363
  • Lastpage
    2366
  • Abstract
    A silicon equivalent proportional counter microdosimeter (SEPCM) and 4 Mb SRAM were exposed to eight progressively hardened neutron energy spectra at the LANSCE ICE House facility. As the incident neutron energy spectra were hardened, the lineal energy spectra response from the SEPCM changed both in shape and in the number of lineal energy deposition events per incident neutron. The general trend of the 4 Mb SRAM single event upset (SEU) cross section was an increase for harder incident neutron energy spectra. Resulting dosimetric results were correlated to SEU cross sections.
  • Keywords
    SRAM chips; dosimetry; neutron detection; neutron effects; proportional counters; radiation hardening (electronics); silicon radiation detectors; SEPCM; SRAM SEU cross sections; Si equivalent proportional counter microdosimeter; lineal energy spectra response; neutron dosimetry; neutron energy spectra; Atmosphere; Counting circuits; Dosimetry; Ice; NASA; Neutrons; Radiation detectors; Random access memory; Silicon; Single event upset;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2003.821604
  • Filename
    1263886