DocumentCode
880089
Title
Correlation of neutron dosimetry using a silicon equivalent proportional counter microdosimeter and SRAM SEU cross sections for eight neutron energy spectra
Author
Gersey, B. ; Wilkins, R. ; Huff, H. ; Dwivedi, R.C. ; Takala, B. ; Donnell, J.O. ; Wender, S.A. ; Singleterry, Robert C., Jr.
Author_Institution
NASA Center for Appl. Radiat. Res., Prairie View A&M Univ., TX, USA
Volume
50
Issue
6
fYear
2003
Firstpage
2363
Lastpage
2366
Abstract
A silicon equivalent proportional counter microdosimeter (SEPCM) and 4 Mb SRAM were exposed to eight progressively hardened neutron energy spectra at the LANSCE ICE House facility. As the incident neutron energy spectra were hardened, the lineal energy spectra response from the SEPCM changed both in shape and in the number of lineal energy deposition events per incident neutron. The general trend of the 4 Mb SRAM single event upset (SEU) cross section was an increase for harder incident neutron energy spectra. Resulting dosimetric results were correlated to SEU cross sections.
Keywords
SRAM chips; dosimetry; neutron detection; neutron effects; proportional counters; radiation hardening (electronics); silicon radiation detectors; SEPCM; SRAM SEU cross sections; Si equivalent proportional counter microdosimeter; lineal energy spectra response; neutron dosimetry; neutron energy spectra; Atmosphere; Counting circuits; Dosimetry; Ice; NASA; Neutrons; Radiation detectors; Random access memory; Silicon; Single event upset;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2003.821604
Filename
1263886
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