• DocumentCode
    880385
  • Title

    Managing subthreshold leakage in charge-based analog circuits with low-VTH transistors by analog T- switch (AT-switch) and super cut-off CMOS (SCCMOS)

  • Author

    Ishida, Koichi ; Kanda, Kouichi ; Tamtrakarn, Atit ; Kawaguchi, Hiroshi ; Sakurai, Takayasu

  • Author_Institution
    Center for Collaborative Res., Univ. of Tokyo, Japan
  • Volume
    41
  • Issue
    4
  • fYear
    2006
  • fDate
    4/1/2006 12:00:00 AM
  • Firstpage
    859
  • Lastpage
    867
  • Abstract
    The analog T-switch (AT-switch) scheme is introduced to suppress subthreshold-leakage problems in charge-based analog circuits such as switched capacitors and sample-and-hold circuits. A 0.5-V sigma-delta modulator is manufactured in a 0.15-μm FD-SOI process with low VTH of 0.1 V using the concept. The scheme is compared with another leakage-suppression scheme based on super cut-off CMOS (SCCMOS) and the conventional circuit which are also fabricated. The sigma-delta modulator based on AT-switch greatly improves 8.1-dB SNDR through reducing nonlinear leakage effects while the modulator based on SCCMOS improves the dynamic range rather than the SNDR by comparing with the conventional sigma-delta modulator.
  • Keywords
    CMOS analogue integrated circuits; analogue circuits; leakage currents; sigma-delta modulation; silicon-on-insulator; 0.1 V; 0.15 micron; 0.5 V; AT-switch; FD-SOI process; SCCMOS; analog T-switch; charge-based analog circuits; leakage-suppression scheme; low threshold voltage transistors; nonlinear leakage effects; sigma-delta modulator; subthreshold leakage; subthreshold-leakage problems; super cut-off CMOS; Analog circuits; CMOS analog integrated circuits; Delta-sigma modulation; Digital circuits; Manufacturing processes; Subthreshold current; Switched capacitor circuits; Switches; Switching circuits; Voltage; FD-SOI; Low; sigma-delta modulator; subthreshold leakage; switched capacitor;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2006.870761
  • Filename
    1610630