DocumentCode
880768
Title
All-MOS charge redistribution analog-to-digital conversion techniques. I
Author
McCreary, James L. ; Gray, Paul R.
Volume
10
Issue
6
fYear
1975
Firstpage
371
Lastpage
379
Abstract
Describes a technique for performing A/D conversion compatibly with standard single-channel MOS technology. The use of a binary weighted capacitor array to perform a high-speed, successive approximation conversion is discussed. The technique provides an inherent sample/hold function and can accept both polarities of inputs with a single positive reference. The factors limiting the accuracy and conversion rate of the technique are considered analytically. Experimental results from a monolithic prototype are presented; a resolution of 10 bits was achieved with a conversion time of 23 /spl mu/s. The estimated die size for a completely monolithic version is 8000 mil/SUP 2/.
Keywords
Analogue-digital conversion; Convertors; Field effect transistors; Large scale integration; Monolithic integrated circuits; analogue-digital conversion; convertors; field effect transistors; large scale integration; monolithic integrated circuits; Analog-digital conversion; Circuits; Logic; MOS capacitors; Memory; Operational amplifiers; Paper technology; Prototypes; Resistors; Switches;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.1975.1050629
Filename
1050629
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